S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-71
V/I polarities
N-channel +V
DS
, +V
G
, -V
BS
, +I
THR
P-channel -V
DS
, -V
G
, +V
BS
, -I
THR
Source-measure units (SMUs)
See the vtati subroutine.
Example
result = vt14(d, g, s, sub, vlow, vhigh, vds, vbs, ithr, niter)
vtati
This subroutine returns the value of the threshold voltage (V
T
) needed to produce a specified drain current (I
DS
).
Usage
double vtati(int d, int g, int s, int sub, double vlow, double vhigh, double vds,
double vbs, double ithr, int niter)
The drain pin of the device
The gate pin of the device
The source pin of the device
The substrate pin of the device
The start of the gate voltage (V
GS
) sweep
The targeted drain current (I
DS
), in amperes
The number of iterations in the search
1.0E+21 = Device triggered on starting voltage
2.0E+21 = Device triggered on end voltage
4.0E+21 = Measured gate current is within 98 % of the 10 µA
current limit
Details
This subroutine executes a binary search on gate-source voltage (V
GS
) to find I
DS
when drain-source
voltage (V
DS
) and substrate bias voltage (V
BS
) are fixed. The number of iterations is programmable.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
BS
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
A typical value for niter is 10 iterations. If niter is less than 2, a value of 2 is used. If it is greater
than 16, a value of 16 is used.