Keithley S530 User Manual

S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-11
Example
result = bvcbo(e, b, c, sub, ipgm, vlim, type);
Schematic
bvcbo1
This subroutine uses the bsweepv LPTLib function to measure collector-base breakdown voltage at a specified
current with the emitter open.
Usage
double bvcbo1(int e, int b, int c, int sub, double vcbmin, double vcbmax, int
nstep, double ipgm, double udelay, char type);
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vcbmin
Input
The starting collector-base voltage (V
CB
), in volts
vcbmax
Input
The ending V
CB
, in volts
nstep
Input
The number of voltage steps
ipgm
Input
The targeted collector-base current (I
CB
), in amperes
udelay
Input
Delay between V
CB
steps, in seconds
type
Input
Type of transistor: "N" or "P"
Returns
Output
Collector-base voltage:
 -1.0 = TYPE not "N" or "P"
 +1.0E + 21 = Device triggered on vcbmin
 +2.0E + 21 = Device triggered on vcbmax

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English