Keithley S530

Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-16 S530-907-01 Rev. A / September 2015
Source-measure units (SMUs)
 SMU1: Forces I
CES
, programmed voltage limit, measures bvces
Example
resu1t = bvces(e, b, c, sub, ipgm, vlim, type);
Schematic
bvces1
This subroutine measure the collector-emitter breakdown voltage using the bsweepV LPTLib function.
Usage
double bvces1(int e, int b, int c, int sub, double vcemin, double vcemax, int
nstep, double ipgm, double udelay, char type);
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vcemin
Input
The starting collector-emitter voltage (V
CE
), in volts
vcemax
Input
The ending V
CE
, in volts
nstep
Input
The number of voltage steps
ipgm
Input
The targeted collector-emitter current (I
CE
), in amperes
udelay
Input
The delay between V
CE
steps, in seconds
type
Input
Type of transistor: "N" or "P"
Returns
Output
Collector-emitter voltage:
 -1.0 = TYPE not "N" or "P"
 +1.0E + 21 = Device triggered on vcemin
 +2.0E + 21 = Device triggered on vcemax