Keithley S530 - Bkdn

S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-9
Example
result = bice(e, b, c, sub, vce, vbe1, vbe2, vsub, npts, ice_last, &beta_last,
&beta_max, &ic_max);
Schematic
bkdn
This subroutine forces a current and measures breakdown voltage on a two-terminal device.
Usage
double bkdn(int hi, int lo, int sub, double ipgm, double vlim);
hi
Input
The HI pin of the device
lo
Input
The LO pin of the device
sub
Input
The substrate pin of the device
ipgm
Input
The forced current, in amperes
vlim
Input
The voltage limit, in volts
Returns
Output
The measured breakdown voltage:
+2.0E + 21 = Measured voltage is within 98 % of the specified voltage
limit
Details
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the bkdn subroutine; this delay is the calculated time required for stable
forcing of ipgm within the vlim voltage limit.
Source-measure units (SMUs)
 SMU1: Forces ipgm, programmable voltage limit, measures breakdown voltage