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Keithley S530

Keithley S530
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Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-76 S530-907-01 Rev. A / September 2015
vtext2
This subroutine estimates the extrapolated gate-source threshold voltage of a metal-oxide field-effect transistor
(MOSFET) using a modified version of the vtext subroutine method.
Usage
double vtext2(int d, int g, int s, int sub, char type, double vlow, double vhigh,
double vds, double vbs, double ithr, double vstep, int npts, double *slope, int
*kflag)
d
Input
g
Input
s
Input
sub
Input
type
Input
vlow
Input
vhigh
Input
vds
Input
vbs
Input
ithr
Input
vstep
Input
npts
Input
slope
Output
kflag
Output
Return status flag:
Returns
Output
Details
This subroutine is a modified version of the vtext (on page 3-73) subroutine. The differences are:
All setup parameters must have the correct sign (polarity)
An initial binary search is done with LPTLib trigi and searchv subroutines
The I
DS
-V
GS
data is measured at one time (LPTLib sweepv, smeasi)
The vlow parameter must be algebraically smaller than the vhigh parameter

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