Keithley S530

S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-37
icbo
This subroutine measures leakage when the collector-base junction is reverse-biased (common base).
Usage
double icbo(int e, int b, int c, int sub, double vcbo, double vsub)
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vcbo
Input
Forced collector-base voltage, in volts
vsub
Input
The forced substrate bias, in volts
Returns
Output
The measured collector-base current
Details
This subroutine measures the collector-base leakage current at a specified collector-base voltage
(V
CB
) and substrate bias (V
SUB
) for a bipolar transistor. The emitter pin is not connected (floating), and
the base is grounded.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPN +V
CB
, -V
SUB
PNP -V
CB
, -V
SUB
Source-measure units (SMUs)
SMU1: Forces V
CB
, default current limit, measures icbo
SMU2: Forces vsub, default current limit