Keithley S530

In this section:
Subroutine descriptions ............................................................ 3-1
Subroutine descriptions
beta1
This subroutine calculates the DC beta () of a test device at constant emitter current (I
E
) and collector-base bias
(V
CB
). The device is in the common-base configuration.
Usage
double beta1(int e, int b, int c, int sub, double ie, double vcb, char type);
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
ie
Input
The forced emitter current, in amperes
vcb
Input
The forced c to b bias, in volts
type
Input
Type of transistor: "N" or "P"
Returns
Output
The calculated beta of the device:
 -1.0 = TYPE not "N" or "P"
 -2.0 = SMU2 overload
 -3.0 = Divide by 0, or  < 0.01
 -4.0 =  > 10 K or I
B
wrong sign
 -5.0 = Emitter voltage limit reached; developed emitter voltage is
within 98 % of the 3 V voltage limit
Details
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the beta1 subroutine; this delay is the calculated time required for stable
forcing of emitter current with a 3 V voltage limit.
Section 3
Test subroutine library reference