Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-60 S530-907-01 Rev. A / September 2015
Example
result = rvdp(pin1, pin2, pin3, pin4, sub, itest, &ratio)
Schematic
tdelay
This subroutine calculates the delay time, in seconds, for the number of pins, current, and voltage specified as
input parameters.
Usage
double tdelay(int npin, double i, double v)
The number of pins connected to the charging node
The calculated delay time
Details
This subroutine calculates the delay based on system capacitance, leakage currents, and the number
of pins connected to the source.
The tdelay subroutine differs from the kdelay subroutine because kdelay calculates and provides
a delay, but tdelay simply returns a value that can be passed into LPTLib calls such as sweepX and
searchX to provide an appropriate delay. See the discussion in the kdelay (on page 3-47) subroutine
for more information.
Example
delay_time = tdelay(npin, i, v)