Keithley S530 - Idsat

Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-42 S530-907-01 Rev. A / September 2015
idsat
This subroutine measures drain-source current (I
DS
) at a specified drain-source voltage (V
DS
) and
substrate-source voltage (V
BS
). The gate is tied to the drain.
Usage
double idsat(int d, int g, int s, int sub, double vds, double vbs)
d
Input
The drain pin of the device
g
Input
The gate pin of the device
s
Input
The source pin of the device
sub
Input
The substrate pin of the device
vds
Input
Drain-source voltage, in volts
vbs
Input
Substrate bias, in volts
Returns
Output
The measured drain current
Details
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
BS
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
N-channel +V
DS
, -V
BS
P-channel -V
DS
, +V
BS
Source-measure units (SMUs)
 SMU1: Forces vds, default current limit, measures I
DS
 SMU2: Forces vbs, default current limit
Example
result = idsat(d, g, s, sub, vds, vbs)
Schematic