Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-40 S530-907-01 Rev. A / September 2015
Source-measure units (SMUs)
SMU1: Forces vces, default current limit, measures ices
SMU2: Forces vsub, default current limit
Example
result = ices(e, b, c, sub, vces, vsub)
Schematic
id1
This subroutine measures drain current (I
DS
) at a specified gate-source voltage (V
GS
), drain-source voltage (V
DS
),
and substrate-source voltage (V
BS
).
Usage
double id1(int d, int g, int s, int sub, double vgs, double vds, double vbs)
The drain pin of the device
The gate pin of the device
The source pin of the device
The substrate pin of the device
The forced gate voltage, in volts
The measured drain current
Details
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
BS
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.