S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-5
Details
This subroutine is a revised version of the beta2 (on page 3-3) subroutine that uses the LPTLib
searchi and trig functions to search I
E
until the target I
CE
is reached.
This subroutine sets the current trigger on SMU1 at the specified I
CE
. The emitter current is searched
until the trigger is set. The emitter current is then forced, the collector current measured, and is
calculated.
The percent error (error) is calculated between the target I
CE
and the final measured I
CE
and
returned.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPN +I
CE
, +V
CB
, I
E,
-V
SUB
PNP -I
CE
, -V
CB
, +I
E
, -V
SUB
Source-measure units (SMUs)
SMU1: Forces V
CB
, maximum current limit, triggers on I
CE
SMU2: Forces 0.0 V, measures I
BE
SMU3: Searches I
E
, 3 V voltage limit
SMU4: Forces V
SUB
, default current limit
Example
result = beta2a(e, b, c, sub, ice, vcb, ie1, ie2, vsub, &icmeas, &ieout, &error);
Schematic