EasyManuals Logo

Keithley S530 User Manual

Keithley S530
93 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Page #30 background imageLoading...
Page #30 background image
Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-18 S530-907-01 Rev. A / September 2015
Details
This subroutine measures the drain-to-source breakdown voltage of a field-effect transistor (FET) with
the gate grounded with the source, at a specified current (magnitude and polarity).
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the bvdss subroutine; this delay is the calculated time required for stable
forcing of ipgm within the vlim voltage limit.
V/I polarities
N-channel +Ipgm
P-channel -Ipgm
Source-measure units (SMUs)
SMU1: Forces ipgm, programmed voltage limit, measures bvdss
Example
result = bvdss(d, g, s, sub, ipgm, vlim);
Schematic

Other manuals for Keithley S530

Questions and Answers:

Question and Answer IconNeed help?

Do you have a question about the Keithley S530 and is the answer not in the manual?

Keithley S530 Specifications

General IconGeneral
BrandKeithley
ModelS530
CategoryTest Equipment
LanguageEnglish

Related product manuals