Keithley S530

S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-63
Example
result = vbes(e, b, c, sub, ipgm, type)
Schematic
vf
This subroutine measures the forward biased junction voltage of a diode when a current is forced.
Usage
double vf(int hi, int lo, int sub, double itest)
hi
Input
The HI pin of the device (anode)
lo
Input
The LO pin of the device (cathode)
sub
Input
The substrate pin of the device
itest
Input
The forced current, in amperes
Returns
Output
Measured voltage:
+2.0E+21 = Measured voltage is within 98 % of the 3 V voltage limit
Details
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the vf subroutine; this delay is the calculated time required for stable
forcing of itest with a 3 V voltage limit.
Source-measure units (SMUs)
 SMU1: Forces itest, 3 V voltage limit, measures voltage