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Satec PM180 - Process Measurement Limits; Deadbands; Textual Descriptions

Satec PM180
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41
Process Measurement Limits
Measurement limits Measurement type
Condition min max
Current (standard inputs) 0
Current Scale × CT Ratio
1, 2
(Imax)
Auxiliary current I4 (standard input) 0
Current Scale × I4 CT Ratio
1, 2
Current (extended inputs) 0
20 × CT Primary current
Auxiliary current I4x (extended input) 0
20 × I4 CT Primary current
Voltage AC 0
Voltage Scale × PT Ratio
3
(Vmax)
Auxiliary voltage V4 0
Voltage Scale × V4 PT Ratio
3
Power signed (kW, kvar)
-Vmax × Imax × 2/1000
Vmax × Imax × 2/1000
4
Power unsigned (kVA, kW
import/export, kvar import/export)
and power demands
0
Vmax × Imax × 2/1000
4
Power factor signed -1.000 1.000
Power factor unsigned (lag, lead) 0 1.000
+/-1mA
-AI full scale × 2 AI full scale × 2
0-20mA AI zero scale AI full scale
4-20mA AI zero scale AI full scale
0-1mA AI zero scale AI full scale
0-50mA AI zero scale
AI full scale × 2
Analog inputs
+/-10V -AI full scale AI full scale
Unbalance 0 300.0
THD 0 999.9
TDD 0 999.9
K-Factor 1.0 999.9
Harmonics 0 100.00
NOTES:
1. CT Ratio = CT primary current/CT secondary current.
2. The default Current Scale is 4 × CT secondary current for devices with a 400% overload (ANSI) or 2
× CT secondary current for devices with a 200% overload (IEC). It can be changed via the Device
Options setup in PAS.
3. The default Voltage Scale is 828V. It can be changed via the Device Options setup in PAS.
4. If PT Ratio = 1.0 and Pmax is greater than 9,999 kW, then it is truncated to 9,999 kW.
Deadbands
The db value represents the percentage of difference between max and min process
measurement limits indicated in the table above. The default db (deadband) attribute values
in functional constraint CF are defined in the ICD file. They can be changed to provide
reasonable conditions for generating reportable events.
Textual descriptions
The default d (textual description of the data) attribute values in functional constraint DC are
defined in the device. They can be changed for descriptions of measured/metered and status
data.

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