Appendix B Specifications
Pulse shape specifications
116 SmartClass E1 Tester User’s Guide
Pulse shape specifications
Table 41 describes the pulse shape specifications.
Jitter specifications
This section provides jitter specifications for the E1 Tester.
Defect (Alarm) Generation LOS, LOF, AIS, TS-16, AIS, RDI/FAS distant, MF
AIS, MF RDI/MFAS distant
Anomaly (Error) Counts Bit (TSE), Code, FAS, MFAS, CRC, E-Bit
Frame Data FAS, NFAS, MFAS words, A-Bit, Sa4, Sa5, Sa6,
Sa7, Sa8
Signal Results Signal loss (seconds), bit slips, Rx level, Tx and Rx
bit rate
BERT Results Bit errors (TSE), bit error rate, errored seconds,
error-free seconds, percentage error-free sec-
onds, pattern slip, round trip delay, pattern loss
second
Audio Monitor From RX1 or RX2
Round Trip Delay Range: 0-10 s
Resolution: 0.1ms
Result Categories Summary, Statistics, Signal, Interface, Frame
Data, Timeslots, BERT, Performance (G.821,
G.826 ISM, G.826 OOS, M.2100 ISM, M.2100
OOS), VF
Table 40 E1 circuit testing specifications (Continued)
Parameter Specification
Table 41 Pulse shape specifications
Parameter Specification
Results Pulse Shape Graph
G.703 mask: Pass/Fail
Pulse Width Resolution: 2.75 ns
Rise Time Resolution: 1 ns
Fall Time Resolution: 1 ns
Undershoot Resolution: 1% of nominal level
Overshoot Resolution: 1% of nominal level
Signal Level In [V] base-peak
Result Categories Summary, LED, Signal, Interface, Frame Data,
BERT, Pulse Shape, Time
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