JDS Uniphase SmartClass E1 - Specifying a BERT Pattern

Chapter 4 E1 Testing
Specifying test application settings
SmartClass E1 Tester User’s Guide 33
Specifying a BERT pattern You can specify a BERT pattern for your test.
To specify a BERT pattern
1 If you haven’t already done so, launch an E1 test application (see
“Launching an E1 test application” on page 28).
2 On the Configuration menu, select BERT Pattern Settings, and then
select Pattern.
3 Select one of the following BERT patterns:
Pattern Description
63 (2^6-1) Selects the 2
6
-1 pseudorandom pattern, which gen-
erates a maximum of 5 sequential 0s and 6 sequen-
tial 1s.
511 (2^9-1) Selects the 2
9
-1 pseudorandom pattern, which gen-
erates a maximum of 8 sequential 0s and 9 sequen-
tial 1s.
2047 (2^11-1) Simulates live E1 data. A pseudorandom pattern
based on an 11-bit shift register. Selects the 2
11
-1
Pseudorandom pattern, which generates a maximum
of 10 sequential 0s and 11 sequential 1s.
2^15-1 ITU Selects the 2
15
-1 pseudorandom pattern, which gen-
erates a maximum of 14 sequential 0s and 15
sequential 1s. Simulates live data for 56 kbit/s to 2
Mbit/s circuits. This is the default pattern for E1.
2^15-1 INV ITU Selects the inverted 2
15
-1 pseudorandom pattern,
which generates a maximum of 14 sequential 1s and
15 sequential 0s.
2^20-1 Selects the 2
20
-1 pseudorandom pattern, which gen-
erates a maximum of 19 sequential 0s and 20
sequential 1s.
2^20-1INV Selects the inverted 2
20
-1 pseudorandom pattern,
which generates a maximum of 19 sequential 1s and
20 sequential 0s.
2^23-1 ITU Selects the 2
23
-1 pseudorandom pattern, which gen-
erates a maximum of 22 sequential 0s and 23
sequential 1s.
2^23-1 INV ITU Selects the inverted 2
23
-1 pseudorandom pattern,
which generates a maximum of 22 sequential 1s and
23 sequential 0s.
Delay Used for measuring round trip delay. Delay pattern
measurement requires a transmitter/receiver loop-
back, with the transmit rate equal to the receive rate.
This test measures round trip delay once per second
(or until the previous delay measurement is com-
plete) for the length of the test, provided pattern sync
is present. Normal BER test results (such as bit
errors and pattern sync) are not available during
delay testing
QRSS Simulates live E1 data. E1 QRSS is a modified 2
20
-1
pseudorandom pattern that allows a maximum of 15
sequential zeros and 20 sequential ones. 2
20
-1 pseu-
dorandom pattern with 14-zero suppression.