JDS Uniphase SmartClass E1 - Launching the datacom application

Chapter 4 E1 Testing
Specifying test application settings
36 SmartClass E1 Tester User’s Guide
4 On the Anomalies/Errors menu, select one of the following anomalies or
errors:
5 If you need to specify other settings for the test, press Cancel to return to
the Configuration menu.
The defect or anomaly settings are configured.
Specifying performance
settings
You can configure settings for ITU performance analysis. This is only available
in the E1 BERT application.
To configure performance settings
1 If you haven’t already done so, launch an E1 BERT test application (see
“Launching an E1 test application” on page 28).
Anomalies/Errors Description/Additional Settings
TSE Test Sequence Errors (bit error).
If you selected TSE, on the Error/Alarm Settings menu,
select TSE Rate Type, and then select one of the fol-
lowing:
Single.
Multiple. Select TSE Error Count, and then specify
the number of TSE error count (1~50).
Rate. Select TSE Error Rate, and then specify one of
the following:
– 1e-2
– 1e-3
– 1e-4
– 1e-5
– 1e-6
– 1e-7
Pattern Slip One or more bits of the test pattern are deleted or
repeated
Code Error Violation of the selected encoding method
CRC Error Cyclical redundancy check error
FAS Errors Frame alignment signal error.
On the Error/Alarm Settings menu, select FAS
Error Count, and then specify the number of
FAS error count (1~4).
MFAS Error Multi frame alignment signal error.
On the Error/Alarm Settings menu, select MFAS Error
Count, and then specify the number of MFAS error
count (1~2).
E-bit Error Remote CRC errors