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Olympus 72DL PLUS - Appendix: Specifications

Olympus 72DL PLUS
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10-014357-01EN, Rev. 2, January 2022
Specifications 45
Appendix: Specifications
This appendix outlines the specifications for the 72DL PLUS precision thickness
gauge and its accessories.
Table 4
Measurements
Parameter Specifications
Modes Mode 1: Single layer measurement between excitation pulse and first
reflection
Mode 2: Delay line or immersion probe time between material
interface echo and first back wall reflection
Mode 3: Time between multiple back wall reflections. Provides
maximum accuracy.
Multilayer: 6 max
Application methods Single layer, Multilayer (6 maximum), Reduction rate, Barrier, Oxide
Units Standard frequency (SF): mm, in., µs
High frequency (HF): µ, mm, mils, in., µs
Resolution: SF Low: 0.1 mm (0.01 in.)
Std: 0.01 mm (0.001 in.)
Hi: 0.001 mm (0.0001 in.)
Resolution: HF Low: 25 µ (1 mil or 0.001 in.)
Std: 2.5 µ (0.1 mil or 0.0001 in.)
Hi: 0.25 µ (0.01 mil or 0.00001 in.)
Velocity range 0.508 mm/µs to 18.699 mm/µs (0.0200 in./µs to 0.7362 in./µs)
Thickness range
(dependent on probe
frequency, probe
type, and material)
SF: Steel 0.20635 mm (0.00825 in.)
HF: Plastic 0.012725.4 mm (0.00051in.)
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