Omicron CP TD1 - CP TD1 Measurement Principle

OMICRON 37
Introduction to capacitance and dissipation factor measurement
4.2 Measurement of Capacitance and Dissipation
Factor / Power Factor
Capacitance (C) and Dissipation Factor (DF) measurement was first published by Schering in 1919
1
and utilized for this purpose in 1924. The serial connected C
1
and R
1
represent the test object with
losses, C
2
the loss-free reference capacitor.
Figure 4-11: CP TD1 measuring principle
The CP TD1 test system utilizes a method similar to that of the Schering bridge. The main difference is
that the CP TD1 measuring principle does not require tuning for measuring C and DF. C
n
is a low loss
reference capacitor.
1. Schering, H.: "Brücke für Verlustmessungen", Tätigkeitsbericht der Physikalisch-Technischen Reichsanstalt, Braunschweig
1919
~
U
0
(t)
U
N
(t) U
X
(t)Z
1
Z
2
I
CN
I
CX
Z
N
C
X
Z
X
, L
X
C
N
Reference path Measurement path