6.15
Technical data and specifications
Measuring the reflectance with the aid of an Ulbricht sphere using a
reference beam for compensation.
Light-emitting diodes (LEDs)
567 nm
642 nm
951 nm
Photodiodes (2)
Over 50,000 measurements
For the zero point and changes in current frequency
2.5% to 90% diffuse reflectance
37.0 °C ± 0.1 °C
All parameter-specific data are encoded in the magnetic strip on the
reverse side of the test strip.
The system either performs automatically or does not require the usual
setting procedures needed in photometric practice, such as zero point,
method, factor, standard concentration, kinetic times, measuring
temperatures, volumes aspirated, incubation times, etc.
The records received are checked for plausibility.
6 (or 7 including printer)
Master Controller
EPROM 128 48
EEPROM 16 0.5
RAM 32 16
Display messages guide the user through the operation.
1. Optical system
Measuring principle:
Light source:
Wave lengths:
Light detectors:
Service life of
the light source:
Automatic
compensation:
Measuring range:
2. Temperature
3. Time of preparation
for a new parameter
4. Accuracy of input
5. Electronics
Microprocessors:
Storage capacity
(in KBytes)
Control of the process:
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