LRF 6019 Integrator Manual
914928_TML_LRF6019_en_Version C
Confidential & Proprietary Safran Vectronix AG – All rights reserved
6.7.2 PBIT (Power built-in test) >LM,Tb,2*<CS><CR>
This command initiates a routine of power built in test to assess the modules health.
The tests shall be initiated only in the normal operating mode and specific subsystems are initiated.
No laser radiation is emitted during this routine.
PBIT command and response
>LM,Tb,2*<CS><CR>
>LM,Tb,2*D9<0D>
Activates Power Built In Test routine.
Example.
>LM,Tb,name,test1,test2*<CS><CR>
>LM,Tb,PBIT,FF,FF*46<0D>
Response of LRF module to the PBIT request.
Example.
Name.
Test result expressed in hexadecimal.
Test result expressed in hexadecimal.
Test result1 converted to binary (1 good, 0 error).
Bit 7: 3.3 V power supply (for dual power supply only).
Bit 6: +5 V (VBAT) under voltage test.
Bit 5: +5 V (VBAT) over voltage test.
Bit 4: Power supply for analog receiver unit under voltage test.
Bit 3: Power supply for analog receiver unit over voltage test.
Bit 2: Power supply for Rx-board under voltage test.
Bit 1: Power supply for Rx-board over voltage test.
Bit 0: Power supply for Tx-board under voltage test.
Test result2 converted to binary (1 good, 0 error).
Bit 0: GO/NOGO status (1 GO, 0 NO GO)
GO = all tests passed.
NO GO = at least one test failed.
Table 24: PBIT command
Example of a PBIT command transaction:
Host LRF Module
Command frame: >LM,Tb,2*D9<0D>
LRF Module Host
Acknowledge frame: >AC*84<0D>
Response frame: >LM,Tb,PBIT,FE,FE*44<0D>
Prompt: <