Agilent InfinityLab LC Series Diode Array Detectors User Manual 141
8 Test Functions and Calibration
Slit Test
Figure 44 Slit Test – Signal
Test Failed
Slit Test Evaluation
Probable cause Suggested actions
1 Air bubble in Max-Light Cartridge Cell.
Flush the flow cell or use the Max-Light Cartridge
Test Cell.
2 Old lamp.
Run the “Intensity Test”. Exchange the lamp if old
or defective.
3 Defective slit assembly.
Please contact your Agilent service representa-
tive.
4 Defective detector main board.
Please contact your Agilent service representa-
tive.
5 Defective optical unit.
Please contact your Agilent service representa-
tive.
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