Agilent Technologies N5230C

Index-12 Service Guide N5230-90024
Index
storage data
IDE, 5-25
strap handle
analyzer
illustrated, 6-39
part number
, 6-38
subgroup
data acquisition and processing, 5-21
front panel, 5-21
subnet mask, LAN , 4-19
substitution
cable, 3-22
calibration kits
, 3-22
verification kits
, 3-22
supplies
EMI/RFI
part numbers
, 6-47
ESD
part numbers
, 6-47
support
contacting Agilent, 2-10
options
, 2-10
organization
, 2-10
synthesized source
functional description of, 5-4
synthesized source group
operation, 5-6
system
adjustments, 3-1, 3-35
EE default
, 3-36
frequency at 10 MHz, 3-35
getting ready
, 3-4
LO power
, 3-36
receiver calibration, 3-39
source calibration
, 3-38
checks
, 3-1
getting ready, 3-4
operating
recovery
, 8-19
specifications
, 3-6
verification
, 3-1, 3-6, 3-19
device connections
, 3-24
dialog box, 3-23
example of results
, 3-26, 3-27
failure flowchart
, 3-25
failure of, 3-25
getting ready
, 3-4
interpreting results
, 3-26
performing, 3-22
procedure
, 3-23
test setup
, 3-23
what it verifies, 3-19
system motherboard
illustrated, 6-13
operation
, 5-23
part number, 6-12
removal and replacement
illustrated
, 7-19
procedure
, 7-18
troubleshooting
, 4-11
T
test
calibration coefficients, 3-33
dynamic accuracy
, 3-34
frequency accuracy
, 3-30
noise floor, 3-31
performance
frequency accuracy
, 3-30
source maximum power output
,
3-29
source power accuracy
, 3-28
test port maximum power output
,
3-29
test port output power accuracy
,
3-28
receiver compression
, 3-31
source power linearity
, 3-29
test port output power linearity
, 3-29
trace noise
, 3-30
test equipment
required for service, 2-7
required for servicing, 2-7
test port
cable checks
connector repeatability failure
, 3-18
dynamic accuracy test, 3-34
maximum output power test
, 3-29
noise floor test
, 3-31
output power accuracy test, 3-28
output power linearity test
, 3-29
test port 1 coupler
illustrated, 6-17, 6-21, 6-25, 6-29
operation
, 5-16
part number
, 6-16, 6-20, 6-24, 6-28
removal and replacement
illustrated
, 7-35, 7-37
procedure
, 7-34, 7-36
test port 2 coupler
illustrated, 6-17, 6-21, 6-25, 6-29
operation, 5-16
part number
, 6-16, 6-20, 6-24, 6-28
removal and replacement
illustrated
, 7-35, 7-37
procedure
, 7-34, 7-36
test port cable
checks, 3-10
accessories used in, 3-12
connector repeatability
, 3-17
insertion loss
, 3-14
insertion loss failure, 3-14
magnitude and phase stability
, 3-15
magnitude and phase stability
failure
, 3-16
performing
, 3-12
return loss
, 3-13
return loss failure
, 3-13
TEST SET I/O
connector
pin assignments
, 5-12
rear panel
, 5-11
test set motherboard
illustrated, 6-17, 6-21, 6-25, 6-29
operation
, 5-11
part number
, 6-16, 6-20, 6-24, 6-28
removal and replacement
illustrated
, 7-25
procedure
, 7-24
test setup
system verification, 3-23
tests
adjustments, 3-35
performance
, 3-7
performance, N7840A
, 3-28
source group
, 4-28
time domain, Option 010 , 2-4
tools
required for servicing, 2-9
service, part numbers, 6-46
top assembly
replaceable parts
illustrated
, 6-33
part numbers, 6-12, 6-32
top assembly, all options
replaceable cables, all
illustrated
, 6-15
part numbers, 6-14
replaceable parts
illustrated
, 6-13
touch screen controller board
removal and replacement
illustrated
, 7-11
procedure
, 7-10
touch screen display
removal and replacement
illustrated
, 7-13
touch screen display assembly
removal and replacement
illustrated, 7-11
procedure
, 7-13
touch-up
paint
part numbers, 6-48
trace
troubleshooting
all traces
, 4-26
troubleshooting all, 4-25
trace A
troubleshooting, 4-25, 4-27
trace B
troubleshooting, 4-25, 4-27
trace noise
test, 3-30
trace R1