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ATEQ F670 User Manual

ATEQ F670
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Sheet #614u – N Tests
Version 1.04a User guide ATEQ 6th series Page 1/2
N TESTS
1. PRESENTATION
N test function: repetition of the test when the result is near the reject level.
It consists in conditionally repeating the test time to optimize the cycle time (rapid decision
making on parts with large leaks or very good parts).
The bad parts (bad but close to the reject level) are subject to a longer test.
The instrument repeats the test time 3 times maximum.
CYCLE PROGRESS:
Step 1:
: 0 < Measured value < Reject = Good Part (standard cycle).
Reject < Measured value < Tolerance A = Run Test time
Again.
Measured value > Tolerance A = Bad Part.
Step 2:
0 < Measured value < Reject = Bad Part (standard cycle).
Reject < Measured value < Tolerance B = Run Test time
Again.
Measured value > Tolerance B = Bad Part.
Step 3 (standard step) :
0 < Measured value < Reject = Good Part (standard cycle).
Measured value > Reject = Bad Part.
This function cannot be enabled in addition to the following functions: ATR; Operator Test;
Burst Test; Temperature Correction; Blockage Test). During the CAL learning cycle CAL, this
function is not activated.

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ATEQ F670 Specifications

General IconGeneral
BrandATEQ
ModelF670
CategoryTest Equipment
LanguageEnglish

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