Hioki DM7275 Series - Page 75

72
Contact Check
Threshold
• The instrument’s contact check threshold is specied as a capacitance value. It can be changed
within the range of 0.5 nF to 50 nF (default setting: 1 nF).
• The following table provides approximate resistance value threshold equivalents for a number of
contact check thresholds:
Threshold value
setting
Resistance value
threshold
0.5 nF 15 k
Ω
5 nF 1.5 k
Ω
50 nF 150
Ω
• If the capacitance between the HIGH and LOW terminals is less than the threshold value, the
instrument will not display a measured value or perform judgment (contact error). Set a low
threshold for small batteries and a high threshold for large batteries.
• The capacitance between the HIGH and LOW terminals can be monitored and used as a
guideline when determining the threshold.
If the capacitance monitor value is the same
as the contact check threshold, the instrument
may either detect a contact error or display the
measured value
.
Contactcheckintegrationtime
The contact check integration time can be changed within the range of 1 ms to 100 ms (default
setting: 10 ms). Use a low value when you wish to increase the measurement speed. Use a high
value in environments with a large amount of noise.
• It is recommended to enable the contact check function when switching among multiple
measurement targets at high speed as part of the measurement process and when measuring
the potential across a battery’s enclosure.
• Set an appropriate trigger delay (p. 39) when measuring the potential across a battery’s
enclosure. In particular, discharge time is required when the enclosure has been charged.
w ww . . co m
information@itm.com1.800.561.8187