C
HP 8167A HP 8168D HP 8168E HP 8168F
Wavelength Range
1280nm to 1330nm 1490nm to 1565nm 1475nm to 1575nm 1450nm to 1590nm
Absolute Wavelength Accuracy,
typ
1
6
0.1nm
6
0.2nm
6
0.1nm
Relative Wavelength Accuracy
6
0.035nm,
6
0.1nm
6
0.035nm,
6
0.035nm
typ
6
0.001nm
2
typ
6
0.001nm
2
(1475-1575nm)
6
0.050nm
(1450-1590nm),
typ
6
0.001nm
2
Wavelength Resolution
0.001nm, 0.1nm 0.001nm, 125MHz at 1550nm
170MHz at 1300nm
Wavelength Stability
<
6
100MHz
6
1GHz
<
6
100MHz
(typ over 1 hour at constant
temperature)
Wavelength Repeatability
6
0.035nm,
6
0.1nm
6
0.035nm,
6
0.035nm
typ
6
0.001nm
2
typ
6
0.001nm
2
(1475-1575nm)
6
0.050nm
(1450-1590nm),
typ
6
0.001nm
2
Sidemode Suppression Ratio, typ
3
>
40dB
(1280-1330nm at
-7dBm)
n/a
>
40dB
(1500-1570nm at
0dBm)
>
50dB
(1475-1575nm at
1dBm)
Source Spontaneous Emission
4
<
-40dB/0.1nm
<
-40dB/0.1nm
<
-45dB/0.1nm
<
-55dB/0.1nm
(1500-1565nm) (1500-1570nm) (1520-1570nm)
<
-35dB/0.1nm
<
-35dB/0.1nm
<
-45dB/0.1nm
(1490-1565nm) (1475-1575nm) (1475-1575nm)
<
-35dB/0.1nm
(1450-1590nm)
Relative Intensity Noise (RIN),
typ
<
-145dB/Hz
Linewidth (typ),
100kHz
coherence control o
Eective Linewidth (typ),
50-500MHz 30-500MHz 50 to 500MHz 50 to 500 MHz
coherence control on
5
(1500-1565nm) (1500-1570nm) (1475-1575nm)
1
Measured with a wavelength meter in a vacuum.
2
Performance when controlled with appropriate wavelength meter.
3
Measured by heterodyning method at specied output power (without options).
4
Measured with optical spectrum analyzer at 0.1nm resolution bandwidth.
5
At power levels larger than CC uncal value.
Specications C-5