MicroP XRF-2000 Series User Manual

XRF-2000 Series Operating Manual
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Appendix B
New Calibration for Disk (V5 Version)
Thickness Calibration (ex: NiP//Al)
1. On Main Window, Go File → Administrator Login → “t” → Enter.
2. Click icon for new calibration on tools Bar and set as shown below.
 Select cal mode: Select application. If not exist, Double Click on Beam
size, Meas Time and High Voltage and perform step 3.
 Beam size: Select collimator size.
 Time: Set measuring Time.
 Sys: Select Live for live time regarding Dead Time.
 MCA: Select MCA channel.
 High Voltage: Set Tube high voltage for element to be analyzed.
(ex-30KV for NiP)
 Use ICR: Check for background ROI.
 Tube Current: Check Auto set to get optimized TC at target Dead time.
Target Dead time: Set 25%
3. To create cal mode, double Click on Beam size, Meas Time and High
Voltage in the new Calibration Window, then Edit Cal. Mode window appears.
Set as shown below.

MicroP XRF-2000 Series Specifications

General

Brand	MicroP
Model	XRF-2000 Series
Category	Measuring Instruments
Language	English