MicroP XRF-2000 Series - Introduction; System Purpose

XRF-2000 Series Operating Manual
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1. Introduction
1.1 System Purpose
XRF-2000 systems are designed to measure the thickness of multi
coating elements or detect the elements in analyzed samples and
determine their concentrations using X-Ray fluorescence (XRF).
The analysis performed by XRF-2000 series can by divided into three
categories:
 Thickness measurement – measure the thickness of multilayer
coating
 Qualitative analysis – Identification of the elements in a sample
and inspection of the acquired spectra on a comparative basis.
 Quantitative analysis – Quantitative determination of the
concentrations of the elements in a sample. This is performed
after carrying out calibration procedures, using a pre-analyzed set
of standards and empirical models, or via the fundamental
parameters method.
The system software (XRayV5) runs under Windows XP, Vista or higher.
XRF-2000 Series