STMicroelectronics STM32F038C6 User Manual

Electrical characteristics STM32F038x6
62/102 DocID026079 Rev 3
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
• A supply overvoltage is applied to each power supply pin.
• A current injection is applied to each input, output and configurable I/O pin.
These tests are compliant with EIA/JESD 78A IC latch-up standard.
6.3.12 I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
SS
or
above V
DDIOx
(for standard, 3.3 V-capable I/O pins) should be avoided during normal
product operation. However, in order to give an indication of the robustness of the
microcontroller in cases when abnormal injection accidentally happens, susceptibility tests
are performed on a sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of the -5
µA/+0 µA range) or other functional failure (for example reset occurrence or
oscillator frequency deviation).
The characterization results are given in Table 43.
Negative induced leakage current is caused by negative injection and positive induced
leakage current is caused by positive injection.
Table 41. ESD absolute maximum ratings
Symbol Ratings Conditions Packages Class
Maximum
value
(1)
Unit
V
ESD(HBM)
Electrostatic discharge voltage
(human body model)
T
A
= +25 °C, conforming
to JESD22-A114
All 2 2000 V
V
ESD(CDM)
Electrostatic discharge voltage
(charge device model)
T
A
= +25 °C, conforming
to ANSI/ESD STM5.3.1
All C3 250 V
1. Data based on characterization results, not tested in production.
Table 42. Electrical sensitivities
Symbol Parameter Conditions Class
LU Static latch-up class T
A
= +105 °C conforming to JESD78A II level A

STMicroelectronics STM32F038C6 Specifications

General

Brand	STMicroelectronics
Model	STM32F038C6
Category	Microcontrollers
Language	English