13.7.1.2 Completing the test
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Continue to test another function or end the test by changing the TESTMODE setting to
Disabled. Restore connections and settings to their original values, if they were
changed for testing purposes.
13.7.2 Overfrequency protection SAPTOF (81)
M16290-2 v7
Prepare the IED for verification of settings outlined in Section
"Preparing the IED to
verify settings".
13.7.2.1 Verifying the settings
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Verification of PICKUP value and time delay to trip
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1. Check that the IED settings are appropriate, for example the pickup value and the
time delay.
2. Supply the IED with three-phase voltages at their rated values and initial
frequency.
3. Slowly increase the frequency of the applied voltage with a 40 mHz step,
applying it for a period that is 10% longer than tDelay.
4. Note the trip value and compare it with the set value.
5. Decrease the frequency to rated operating conditions.
6. Check that the PICKUP signal resets.
7. Set the frequency to 20 mHz under the trip value.
8. Increase the frequency with a 40 mHz step, applying it for a period that is 10%
longer than tDelay.
9. Measure the time delay for the TRIP signal, and compare it with the set value.
Note that the measured time consists of the set value for time delay plus
minimum trip time of the pickup function (80 - 90 ms).
Extended testing
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1. The test above can be repeated to check the time to reset.
Verification of the low voltage magnitude blocking
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1. Check that the settings in the IED are appropriate, for example the PUFrequency
and the tDelay.
2. Supply the IED with three-phase voltages at their rated values.
3. Slowly decrease the magnitude of the applied voltage, until the BLKDMAGN
signal appears.
1MRK 502 073-UUS A Section 13
Testing functionality by secondary injection
Generator protection REG670 2.2 ANSI and Injection equipment REX060, REX061, REX062 233
Commissioning manual
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