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Agilent Technologies 54830 Series Service Guide

Agilent Technologies 54830 Series
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Chapter 1: General Information
Specifications & characteristics
1–9
Digital Vertical
Analog Vertical
Number of Channels 16 Digital - label D15 - D0
Threshold Groupings Pod1: D7 - D0
Pod2: D15 - D8
Threshold Selections TTL, 5.0 V CMOS, 3.3 V CMOS, 2.5 V
CMOS, ECL, PECL, User Defined
User-Defined Threshold
Range
±8.00 V in 10 mV increments
Maximum Input Voltage ±40 V peak CAT I
Threshold Accuracy ± (100 mV +3% threshold setting)
Input Dynamic Range ±10 V about threshold
Minimum Input Voltage Swing 500 mV peak-to-peak
Input Impedance 100 k ±2.0% (8 pF) at probe tip (Digital)
Channel-to-Channel Skew 2 ns typical, 3 ns maximum
Glitch Detect 2.5 ns
Resolution 1 bit
Number of Channels 54830B/D & 54833A/D 2 (simultaneous acquisition)
54831/32B/D 4 (simultaneous acquisition)
Bandwidth Analog Bandwidth (-3dB)* 50: 600 MHz — Agilent 54830/31B/D
50: 1 GHz — Agilent 54832B/D & 54833A/D
1 M: 500 MHz (with Agilent 1165A probe)
Rise Time
1
50: 583 ps (Agilent 54830/31B/D)
50: 350 ps (Agilent 54832B/D &
E54833A/D)
1 M: 700 ps
Sensitivity
2
1 M Coupling: 1 mV/div to 5 V/div
50 Coupling: 1 mV/div to 1 V/div
Resolution 8 bits (0.4% of full scale)
Input Impedance* 1 M ± 1% (13 pf), or 50 ± 1.5%
Input Coupling 1 M:AC, DC; 50DC
Maximum Input Voltage 1 M: 150 V RMS or DC CAT 1; ± 250 V (DC + AC) in AC coupling
50 : 5 V
rms
, CAT I
Channel-to-channel Isolation
(with channels at equal
sensitivity)
dc to 50 MHz: 50 dB
50 MHz to 500 MHz: 40 dB
500 MHz to 1 GHz: 30 dB
Offset Range Vertical Sensitivity (50Ω) Available Offset
1 mV to <5 mV/div
5 mV to <200 mV/div
200 mV to 1 V/div
± 2 V
± 5 V
± 20 V
Vertical Sensitivity (100Ω) Available Offset
1 mV to <10 mV/div
10 mV to <20 mV/div
20 mV to <100 mV/div
100 mV to <1 V/div
1 V to 5 V/div
± 2 V
± 5 V
± 10 V
± 20 V
± 100 V
Dynamic Range ± 8 div from center screen (1 M)
±12 div from center screen (50 )

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Agilent Technologies 54830 Series Specifications

General IconGeneral
BrandAgilent Technologies
Model54830 Series
CategoryTest Equipment
LanguageEnglish

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