76
Setting screen will appear as follows:
From the Run Test Parameter Setting screen, the following parameters may be
controlled: Voltage-HI, Voltage-LO, Amp-HI, Amp-LO, Dwell Time, Delay Time,
Leakage-HI, Leakage-LO, Power-HI, Power-LO, PF-HI and PF-LO, AC Source, Active
Link, Select Meter and Step Name.
PF (Power factor)
Power Factor = W/VA where W =Watts (Real Power) and VA =Volts x Amps (apparent
power). It is important to note that the closer the power factor is to "1" the more
resistive the DUT is. The closer the power factor is to 0 the more reactive (inductive
or capacitive) the DUT is.
Leakage (Leakage-HI and Leakage-LO)
Leakage in the Run Test mode refers to the amount of current which flows from the
enclosure (case) of the DUT to the neutral side of the line input. The Leakage-HI trip
limit is used to program the maximum allowable earth leakage current of the DUT
before failure. The Leakage-LO trip limit is used to program the minimum allowable
earth leakage current of the DUT before failure. The Leakage-HI trip limit also controls
the earth leakage configuration as shown below:
To Next Page
Loading...
Need help?
General
