: Programm screenshot (graph example 2)
Memory effects of the copper oxide can cause tailing of the low carbon range in the level of 10
to 50 mV. However the tailing level does not grow due to faulty copper oxide.
Possible solution:
- Replace the copper oxide
3. Path window is not sealed or it is broken
If the faulty window is on the chopper housing side, all available cells have a tailing due to
combustion gases entering the chopper housing causing permanent IR absorption for all cells
available.
If the faulty window is on the IR sensor side, there is tailing of the damaged cell only.
Solution:
-Replace the part having the faulty window.
Replacing the window only, is rather tricky because the window should be available, the faulty
window must be removed, the surface for gluing new window must be cleaned from old glue
and rests of the broken window, there must be glue available being suitable to glue windows
(two components glue) and time should also be available to wait until the glue is solid.
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