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Filtec FT-50 - Fill Level Inspection Basics

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Chapter 1: FT-50 System Overview
Industrial Dynamics Company, Ltd. Document 40272-0700 1-3
Fill Level Inspection Basics
The FT-50 Fill Level Inspection systems utilizes a Container Radiation
Profile Comparison Principle to create a radiation fingerprint of the
container.
To create a radiation profile a gamma beam is directed through the
container. Some of the radiation is blocked by the container material and
containers contents while the remaining gammas emerge from the
opposite side of the container where they are measured by an gamma
detector.
The amount of radiation measured is the containers radiation profile, or
fingerprint, which is then compared against a Master Container Profile.
Figure 1-2.
Scanning the container.
To allow for slight variances in the fill level an underfill threshold or
overfill threshold is determined. These thresholds form the tolerance
range for deviation from the master profile. Any container with a gamma
count above the underfill threshold (higher gamma counts indicate there
is less product to absorb the gamma beam) is rejected as an underfill. Any
container with a gamma count below the overfill threshold (lower gamma
counts indicate there is more product to absorb the gamma beam) is
rejected as an overfill.
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6
INDUSTRIAL DYNAMICS
Torrance, California USA
MODEL FT-50
FILL LEVEL INSPECTOR
4
3
5
1
2
1
32
No. Description
1 gamma Source
2 gamma Beam
3gamma Detector

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