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Chapter 5, AF Analyzer Screen
Block Diagram
Scope To
Oscilloscope To selects the signal source for the Oscilloscope. This allows you to
bypass certain sections of the AF analyzer’s circuitry when viewing and
measuring a signal. It also allows you to select measurement paths that include
additional gain stages, improving the oscilloscope’s resolution when measuring
low-level signals.
See Also
Figure 12, "AF ANALYZER Functional Block Diagram," on page 96
Settling
This field selects the settling time for making AF measurements. Lower frequency
signals require additional settling time (
Slow). Higher frequency measurements
require less settling time (Fast).
Operating Considerations
Use Slow for ≤200 Hz signals. Use Fast for >200 Hz signals.
If the signal being measured is a composite of different frequencies above and
below 200 Hz, select the appropriate filtering to analyze the desired signal
component.
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