Page 26 of 110 150821/A4 Operation
Interface:
Handler: Device for remote control of test instrument in component
handling operations.
IEEE-488: General Purpose Interface Bus (GPIB). GPIB is an industry
standard definition of a Parallel bus connection for the purpose of
communicating data between devices.
RS232: An industry standard definition for a Serial line communication
link or port.
Scanner: An electronic device designed to switch or matrix signals.
Level: The test signal level is the programmed RMS voltage of the
generator in an LCR meter. The actual test voltage across the
DUT is always less than the programmed level. Refer to VM/IM
feature to view actual signal across DUT.
Limits:
High Limit: The high limit is the upper value for a test to be considered a pass.
If the measured value is higher than the high limit the test is
considered a fail.
Low Limit: The low limit is the lower value for a test to be considered a pass.
If the measured value is lower than the low limit the test is
considered a fail.
Parameter: Electrical property being tested. The primary parameter (L, C, R)
is the first property characterized of the device under test. The
secondary parameter (D, Q, θ) is the second property characterized
of the device under test.
Permittivity: Abbreviated ε. The dielectric constant multiplied by the dielectric
constant of empty space (ε
0
), where the permittivity of empty
space (ε
0
) is a constant in Coulomb’s Law, equal to a value of 1 in
centimeter-gram-second units and to 8.854x10
-12
farads/meter in
rationalized meter-kilogram-second units.
Range: The resistance ranges the instrument uses for reference in making
the measurement.
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