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Cirris 4200 - 17 Interpreting Test Results

Cirris 4200
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36
Cirris 4200 Series User Manual
17. Interpreting Test Results
When an assembly fails a test, the Test window will display information about the errors that caused the failure. The follow-
ing examples show frequent errors operators may encounter:
Low Voltage Errors
Low voltage errors identify errors in the cable wire pattern. When
the tester detects a low voltage error, the screen will display detailed
information about the error.
The rst line shows that the low voltage test failed.
The second line describes the type of error.
OPEN: The intended electrical path contains a gap across
which electric current cannot pass.
SHORT: An unintended connection between 2 or more points.
This failure indicates insucient insulation between unintend-
ed connections.
The third line denes the location of the error. For example, the above image shows an Open error between test points J1-
001 and J1-014.
In the case of a miswire, a fourth line will provide the third point in the
error.
MISWIRE: An unintended connection which is the result of
unexpected contact. This error is often referred to as an Open
and a Short combined.
The example to the right shows an Open error between test points
J1-001 and J1-014 and a short from J1-014 to J1-002.
Component Errors
When the tester creates a new test program containing a component,
it will measure the component value in the sample device and assign
a default tolerance range. During a test, if the tester measures a value
outside of the tolerance range, the component instruction will fail
with an error message that indicates the value measured, as well as the expected value.
Note: You can change the expected component value and the tolerance range by editing the test program in a text editor.
High Voltage Errors – 4250 only
Overcurrent Error:
An overcurrent error occures when the current has exceeded an internal limit during the ramp phase for the net
or point given in the error message. This often means that there is an unintended connection in the device so that
more current is owing than expected as the tester ramps up to the test voltage.
This error could also be caused when the tester is charging the net or point given in the error message and the
capacitance in the DUT is too high. A limit is in place to ensure safety while testing, so testing is immediately halted
when the limit is reached.
Failed
Failed
Low Voltage Test: Failed
Net 1: OPEN
J1-001 to J1-014
Failed
Failed
Low Voltage Test: Failed
Net 1: OPEN
J1-001 to J1-014
MISWIRE to J1-002

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