Epec 5050 - Page 66

5050 CONTROL UNIT
Technical Manual & Cabling Instructions
66 / 92
19.10.2012
5050 / MAN000539
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Epec Oy Postiosoite/Postal address Puhelin/Phone Fax Internet
Tiedekatu 6 PL/P.O.Box 194 +358-(0)20-7608 111 +358-(0)20-7608 110 www.epec.fi
FIN-60320 Seinäjoki FIN-60101 Seinäjoki, Finland
Immunity of ESAs to electromagnetic
radiation
• Test method E/ECE Reg. No. 10, Annex 9
• Performance criterion: No degradation of ‘Immunity-
related functions'
• Sweep step: 1%, time/step: 3 s
Specification
Frequency
Range
(MHz)
Test level
Modulation
AM80% 1 kHz
20-800
30 V/m
(constant
peak)
PM
577/4600ms
800-2000
30 V/m
(constant
peak)
Classification of functional status
Class A:
All functions of a device/system perform as designed during and after exposure to disturbance.
Class B:
All functions of a device/system perform as designed during and after exposure to disturbance. However,
one or more of them can go beyond specified tolerance. All functions return automatically to within normal
limits after exposure is removed. Memory functions shall remain class A.
Class C:
One or more functions of a device/system do not perform as designed during exposure but return
automatically to normal operation after exposure is removed.
Class D:
One or more functions of a device/system do not perform as designed during exposure and do not return to
normal operation until exposure is removed and a device/system is reset by simple “operator/use” action.
Class E:
One or more functions of a device/system do not perform as designed during exposure and cannot be
returned to operation without repairing the device/system.