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Keithley 6220 User Manual

Keithley 6220
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6-4 Averaging Filter, Math, and Buffer Model 6220/6221 Reference Manual
Return to Section 6 topics
3. With the filter settled, the storage of filtered Delta readings begin. The next
25 Delta cycles yields 25 filtered readings, which are stored in the buffer.
4. After the 25
th
Delta reading is stored in the buffer, the Delta test stops.
For the above example, 35 Delta cycles were performed. The first 10 Delta cycles
filled the filter stack, and the next 25 Delta cycles filled the buffer.
Repeating filter
Basic repeating filter operation – As shown in Table 6-1, the repeating average
filter can be used with Delta, Pulse Delta (Fixed output), and Differential Conduc-
tance.
As shown in Figure 6-1B, the repeating filter takes a specified number (count) of
reading conversions, averages them, and yields a reading. It then flushes its stack
and starts over.
The filter stack must be filled with delta readings and then averaged to yield (and
store) one filtered delta reading. The stack is emptied, and the “fill and average”
process is repeated to yield (and store) another filtered reading.
This “fill and average” process is repeated for every specified delta cycle. For
example, assume the repeating average filter count is 10 and the delta test is con-
figured to perform 25 cycles. For these test parameters, 250 delta cycles will be
performed to store 25 filtered delta readings in the buffer.
Differential Conductance – When using the repeating filter, the actual step size
run for the test is the programmed step size divided by the filter count:
Step Size (repeating filter) = Programmed Step Size / Filter Count
For example, assume the programmed step size is 10µA and the Filter Count is
10. When the Differential Conductance test is run, the actual step size will be 1µA
(10µA / 10).
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Table of Contents

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Keithley 6220 Specifications

General IconGeneral
Voltage Resolution1 µV
Compliance Voltage±10 V
InterfaceGPIB, RS-232
Output ModesDC, Pulse, Sweep
Power Requirements100-240 VAC, 50/60 Hz
Dimensions8.4 in × 3.5 in × 13.8 in

Summary

Manual Print History

Safety Precautions

Output Connections

Output Connectors

Details on the triax and banana jack connectors used for current source output.

Guards

Overview of Triax Cable Guard and Banana Jack Guard for high impedance DUT measurements.

Connections to DUT

Information on using the supplied triax cable and basic connections to the Device Under Test.

Using a Test Fixture

Guidance on connecting the Model 622x to custom-built test fixtures.

DC Current Source Operation

Current Source Output Capabilities

Details on current ranges, voltage compliance, output power, and output response.

Setting Source and Compliance

Procedures for setting source and compliance values via front panel and remote operation.

Sourcing Current

Steps to source current, including connecting the DUT and enabling the output.

Sweeps

Sweep Characteristics

Details on linear staircase, logarithmic staircase, and custom sweep characteristics.

Front Panel Sweep Operation

Instructions for configuring and running sweeps using the front panel.

Remote Sweep Operation

Procedures for programming and running sweeps remotely using SCPI commands.

Delta, Pulse Delta, and Differential Conductance

Overview

Introduction to Delta, Pulse Delta, and Differential Conductance measurements.

Test Systems

Requirements and configurations for Delta, Pulse Delta, and Differential Conductance tests.

Data Flow and Read Commands

Explanation of data flow and commands for reading measurements.

Measurement Units

Details on selecting Volts, Ohms, Power, or Conductance units for readings.

Delta

Basic measurement process and technique for Delta measurements.

Pulse Delta

Measurement process and techniques for Pulse Delta measurements.

Differential Conductance

Measurement process and calculations for Differential Conductance.

Averaging Filter, Math, and Buffer

Averaging Filter

Explanation of moving and repeating averaging filters for noisy measurements.

Math

Details on mX+b and m/X+b functions for manipulating delta readings.

Buffer

Information on buffer characteristics, storing readings, and recalling data.

Wave Functions (6221 Only)

Wave Function Characteristics

Summary of characteristics for sine, square, ramp, and arbitrary waveforms.

Front Panel Wave Function Operation

Procedures for generating waveforms using the front panel menus.

Remote Wave Function Operation

Commands for programming and generating waveforms remotely.

Triggering

Trigger Models

Overview of trigger models for sweep control and operation.

Front Panel Trigger Operation

Steps for configuring triggering functions using the front panel menu.

Remote Trigger Operation

Example of using remote trigger configuration to enhance sweeps.

External Triggering

Details on external trigger connectors, requirements, and examples.

Limit Test and Digital I/O

Limit Test

Overview of limit testing to check compliance and set fail patterns.

Digital I/O Port

Description of the digital I/O connector, applications, and +5V output.

Remote Operations

Selecting and Configuring an Interface

Guidance on selecting and configuring GPIB, RS-232, and Ethernet interfaces.

Programming Syntax

Explanation of syntax for common and SCPI commands.

GPIB Interface Reference

Details on GPIB bus standards, connections, and commands.

RS-232 Interface Reference

Information on RS-232 data transfer, settings, and connections.

Ethernet Interface Reference

Details on Ethernet standards, systems, connections, and settings.

Using the Example Software

Guidance on using the provided example software for instrument control.

Status Structure

Overview

Introduction to status registers and queues for monitoring instrument events.

Clearing Registers and Queues

Commands to reset status registers and clear queues.

Programming and Reading Registers

How to ascertain parameter values for programming enable registers.

Status Byte and Service Request (SRQ)

Explanation of the status byte register and service request enable register.

Status Register Sets

Description of condition, event, and enable registers for status reporting.

Common Commands

Common Commands

Summary of IEEE-488.2 common commands and queries.

DISPlay, FORMat, and SYSTem Key-Press Codes

DISPlay Subsystem

Commands to control the display remotely and manage text messages.

FORMat Subsystem

Commands to select data formats for transferring delta data over the bus.

SYSTem Key-Press Codes

Mapping of front panel key presses to SYSTem commands.

SCPI Reference Tables

General Notes

General syntax rules and definitions for SCPI commands.

Calculate Command Summary

Summary of SCPI commands for math and limit testing.

Display Command Summary

Summary of SCPI commands for controlling the instrument display.

Format Command Summary

Summary of SCPI commands for selecting data formats.

Output Command Summary

Summary of SCPI commands for controlling the output state.

Sense Command Summary

Summary of SCPI commands for readings from the Model 2182/2182A.

Source Command Summary

Summary of SCPI commands for current source output.

Status Command Summary

Summary of SCPI commands for reading status registers.

System Command Summary

Summary of SCPI commands for system configuration and control.

Trace Command Summary

Summary of SCPI commands for buffer control.

Trigger Command Summary

Summary of SCPI commands for trigger configuration.

Units Command Summary

Summary of SCPI commands for setting measurement units.

KI-220 Language

Introduction

Overview of using the KI-220 language mode for Model 220 emulation.

Performance Verification

Introduction

Overview of performance verification procedures for qualified service personnel.

Test Requirements

Conditions, warm-up period, line voltage, and equipment needed for verification.

Recommended Test Equipment

List of recommended test equipment and their key specifications.

Calculating Test Limits

Guidance on calculating test limits based on accuracy specifications.

Restoring Factory Defaults

Procedure to restore the instrument to its factory default settings.

Test Summary and Considerations

Overview of test procedures and important considerations before testing.

Verification Procedures

Detailed steps for verifying DC current output, compliance, and waveform accuracy.

Calibration

Introduction

Overview of calibration procedures for service personnel.

Calibration Requirements

Conditions, warm-up period, line power, and equipment for calibration.

Recommended Calibration Equipment

List of recommended equipment and their specifications for calibration.

Restoring Factory Defaults

Procedure to restore the instrument to factory defaults before calibration.

Calibration Summary and Considerations

Summary of calibration procedures and important considerations.

Calibration Procedures

Detailed steps for front panel and remote calibration.

SCPI Commands — Calibration

Reference table for SCPI commands used in calibration.

Calibration Dates, Count, and Password

How to view calibration dates/count and change the calibration password.

Specifications

Error and Status Messages

Introduction

Overview of coded error and status messages and the error queue.

IEEE-488 Bus Overview

Introduction

Description of the IEEE-488 bus as a communication system.

Bus Description

Overview of IEEE-488 bus signal lines and device operators.

Bus Lines

Description of data, management, and handshake bus lines.

Bus Commands

Explanation of uniline, multiline, common, and SCPI bus commands.

Common Commands

Commands common to all devices on the bus.

SCPI Commands

Commands particular to each device, based on SCPI standards.

Interface Function Codes

Codes defining instrument capabilities for interface functions.

IEEE-488 and SCPI Conformance Information

Introduction

Summary of IEEE-488.2 requirements and SCPI compliance.

Applications

Calibration Source

Using the Model 622x as a current calibration source with custom sweeps.

Resistivity Measurements

Test system setup for measuring resistivity of semiconductor materials.

Diode Characterization

Simple test system for plotting I-V characteristics of a diode.

Transistor Characterization

Using the Model 622x with a SourceMeter to characterize BJT DC parameters.

External User-Supplied Filter

Using a user-supplied filter to reduce high frequency noise from the Model 622x.

Compliance Overshoot Prevention

Options to prevent or minimize compliance overshoot.

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