E-4 Applications Model 6220/6221 Reference Manual
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Diode characterization
With the Model 622x, it is possible to plot I-V (current-voltage) characteristics of a
diode over several decades. A simple test system for diode characterization is
shown in Figure E-2.
The Model 6514, with its high input resistance (>200TΩ in parallel with 20pF), will
allow the voltage measurement to be made accurately. Figure E-3 shows several
examples of diodes whose curves have been plotted using the test system shown
in Figure E-2.
Figure E-2
Diode characterization test system
NOTE A standard DMM cannot be used to accurately measure the
voltage across the diode because its much lower input resis-
tance would cause loading error. However, a standard DMM
can be used to make the voltage measurement at the banana
jack GUARD terminal of the Model 622x (see “Banana Jack
Guard,” on page 2-12).
622x
Current Source
6514
Electrometer
Diode
Under
Test
Input
Output
Hi
Hi
Lo
Lo
VF
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