E8257D/67D, E8663D PSG Signal Generators Service Guide 133
Troubleshooting
Troubleshooting Option UNR/UNX/UNY and Instruments with Serial Prefixes ≥
US4805/MY4805 Phase Noise
Troubleshooting Option UNR/UNX/UNY and Instruments with Serial
Prefixes ≥ US4805/MY4805 Phase Noise
Poor grounds or shielding problems in either the test environment or the
measurement system can cause the phase noise measurement to fail. Physical
vibration is another common cause of phase noise. Before performing a phase
nose measurement make sure all covers are installed, the work surface is free
of physical vibrations, and the phase noise system is working properly.
Phase noise failures at specific offsets are fairly predictable. After making sure
the measurement accurately reflects a failure, use Table 1-27 to troubleshoot
phase noise problems. The troubleshooting procedure consists of assembly
substitution.
Table 1-27 Phase Noise Failures
Frequency Offset Most Likely Assembly
0 to 100 Hz A32 High Stability Time Base
100 Hz to 10 kHz A7 Reference
<5 kHz to 10 kHz A6 Frac–N; A45 Frac-N (Option UNY)
10 kHz to 100 kHz A5 Sampler; A46 Offset (Option UNY)
>100 kHz to 1 MHz A28 YIG Oscillator or A9 YIG Driver
Frequencies <3.2 GHz A8 Output
Frequencies >3.2 GHz A29 20 GHz Doubler or A30 Modulation Filter
Frequencies >20 GHz A27 40 GHz Doubler
In non–Option UNR/UNX and instruments with serial prefixes ≥ US4805/MY4805,
the most likely assemblies and frequency offset are the same except for <100 Hz.
In non–Option UNR/UNX and instruments with serial prefixes ≥ US4805/MY4805,
the most likely assembly for <100 Hz offset is the A7 Reference.
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