Keysight Technologies E8257D User Manual

414 E8257D/67D, E8663D PSG Signal Generators Service Guide
Post–Repair Procedures
Post–Repair Procedures Matrix
Table 4-12 Performance Tests: Assemblies A30—A46, AT1, B1, and RF Output Connector
(For prefixes >= xx4928)
Performance Tests Replaced Assembly
The following performance tests are listed in the order that
they should be performed to minimize changes in test
equipment configurations.
A30 Mod Filter with High Power A30 Mod Filter with Standard Power A31 Motherboard A32 10 MHz Crystal Oscillator A34 Internal Hard Drive A35 3 − 20 IQ Modulator A36 Quadraplier A37 Up Converter A38 Lowband Switch Filter A39 Directional Coupler A40 Compact Flash Drive A43 LB Amp/Filter A44 Scan Mod A45 Frac-N/Offset A46 Offset Loop AT1 115 dB Attenuator B1 Fan RF Output Connector
Self Check Test
X X X X
X X X X
?
X X
X X X
Maximum Leveled Output Power
X X
X X X X X X
X X
Maximum Leveled Output Power - Digital Mode (E8267D
Option HBL Only)
X X
Maximum Leveled Output Power - Wide IQ/FM Mode (E8267D
Option H18 Only)
X X
Power Level Accuracy
X X X
X X X X
X X
Internal Pulse Modulation Level Accuracy (E8257D/E8267D
Option UNU, UNW, UNS, or HNS, and E8663D Only)
X X
X X
Internal Pulse Modulation Rise/Fall Time (E8257D/E8267D
Option UNW, UNS, or HNS, E8663D Option UNW)
X X
X X
DC FM Carrier Offset (E8257D/E8267D/E8663D Option UNT) X X
Harmonic Spurious
X X
X X X X X X
X
Sub–Harmonic Spurious X X X X X X
Non–Harmonic Spurious
X X
X X X X X X
X
Single-Sideband Phase Noise (Option UNX or UNY test
procedure)
X
X X X X
Single-Sideband Phase Noise (Non-Option UNX or UNY test
procedure)
X
X X
Residual Phase Noise (E8257D/E8267D/E8663D Option UNX
or UNY and without H5Y Only) (Manual Performance Test)
X
XX XX
Internal EVM Digital Modulation Quality (E8267D Option 601
or 602 Only)
X X
Digital Modulation Power Relative to CW (E8267D Only)
X
X

Keysight Technologies E8257D Specifications

General

Brand	Keysight Technologies
Model	E8257D
Category	Portable Generator
Language	English