LPC5411x All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2018. All rights reserved.
Product data sheet Rev. 2.1 — 9 May 2018 64 of 105
NXP Semiconductors
LPC5411x
32-bit ARM Cortex-M4/M0+ microcontroller
[2] Simulated using 10 cm of 50 Ω PCB trace with 5 pF receiver input. Rise and fall times measured between
80 % and 20 % of the full output signal level.
[3] The slew rate is configured in the IOCON block the SLEW bit. See the LPC5411x UM10914 user manual.
[4] C
L
= 20 pF. Rise and fall times measured between 90 % and 10 % of the full input signal level.
11.3 Wake-up process
[1] Typical ratings are not guaranteed. The values listed are at room temperature (25 C), nominal supply
voltages.
[2] The wake-up time measured is the time between when a GPIO input pin is triggered to wake the device up
from the low power modes and from when a GPIO output pin is set in the interrupt service routine (ISR)
wake-up handler.
[3] FRO enabled, all peripherals off. PLL disabled.
[4] RTC disabled. Wake up from deep power-down causes the part to go through entire reset
process. The wake-up time measured is the time between when the RESET
pin is triggered to wake the
device up and when a GPIO output pin is set in the reset handler.
[5] FRO disabled.
Table 23. Dynamic characteristic: Typical wake-up times from low power modes
V
DD
= 3.3 V;T
amb
=25
C; using FRO as the system clock.
Symbol Parameter Conditions Min Typ
[1]
Max Unit
t
wake
wake-up
time
from Sleep mode
[2][3]
-2.0 -s
from Deep-sleep mode
[2][3][5]
-19 -s
from deep power-down mode;
RTC disabled; using RESET
pin.
[4][5]
-1.2 -ms
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