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Tektronix 2445A - Front-Panel LED Device Codes

Tektronix 2445A
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Maintenance-2445A/2455A Service
READY
LED
(bit 2)
OFF
OFF
OFF
OFF
ON
ON
ON
ON
Table 6-8
Front-Panel
LED
Device Codes
Device Code
+
-
LED LED
(bit 1) (bit 0)
OFF
OFF
OFF
ON
ON
OFF
ON
ON
OFF
OFF
OFF
ON
ON
OFF
ON
ON
Device
Number
0
1
2
3
4
5
6
7
Even
if a
Kernel
test fails, the operator
may
try to go to
normal oscilloscope operation by pressing the
NB
TRIG
select push button.
Depending
on
the exact nature of the
failure, the instrument
may
or
may
not
be
functional.
Kernel
tests
are
automatically executed at power-up.
The
Kernel
tests
are
divided into
RAM
tests
and
ROM
tests
as
follows:
RAM
TEST. This test is done with a complementary
data pattern starting at the highest
RAM
address available
and
continuing to the lowest. The process reads
and
saves the original data,
and
then writes a pattern of
01010101
's
(55
Hex)
at the highest
RAM
memory address.
The
data is then
read
back to
see
if it is still
55
(Hex).
Next a complementary pattern of 10101010
(AA
Hex)
is
written to the
same
address.
Then
the address content
is
read
back
and
tested to
see
if it
is
still
AA
(Hex).
After the
memory
is
checked, the original data
is
written
back
into
the memory address.
RAM
TEST
then
checks
the
next
lower address.
The
testing continues until
all
of
RAM
is
checked.
Test checks:
RAM
address decoding,
RAM
address
lines,
RAM
data
lines,
RAM
memory,
and
Data
Bus
Buffers.
ROM
TEST.
The
ROM
test performs three checks
on
each
of the system read-only memories.
Data
Bus
Drive-
Two locations containing
complementary data patterns
are
read.
6-14
Test checks:
Data
bus
lines
and
the Data Bus Driver.
Correct
Part-A
byte
in
the
ROM
being
checked
is
compared to the most-significant byte of the addressed
ROM
block (starting address of where the
ROM
should
be
installed).
Test checks:
ROM
address decoding
and
proper
installation of
ROM
components.
Checksum-A
sixteen bit, spiral-add checksum
is
calculated
and
compared
to
a two-byte
value
stored
in
ROM
being
checked.
Test checks:
ROM
contents,
ROM
addressing,
ROM
data
lines,
and
the Data Bus Driver.
Confidence Tests
The Confidence tests provide checks for
much
of the
remaining circuitry to ensure that instrument operation is
correct. Confidence tests are performed automatically at
power
-up
after the
Kernel
is determined to
be
functional or
initiated
by
the operator from the Diagnostic Monitor.
A failure of
any
Confidence test during power-up will
pass control to the Diagnostic Monitor; this permits the
test results to
be
examined. Descriptions of the
Confidence tests follow.
INTERRUPT
REQUEST
(Test 01).
Ten
consecutive
interrupt cycles are checked to ensure that succeeding
interrupts occur not more
than
4.5
ms
apart (5600 "E"
cycles).
Test checks: Interrupt Timer circuitry.
SWITCH
STUCK
(Test 02).
The
front-panel,
momentary-contact switches
are
scanned, checking for a
closed switch. At power-up, the test runs immediately.
By holding
one
of the momentary switches
in
a closed
position
when
power is first applied, this test will fail,
and
the Diagnostic Monitor will
be
entered.
When
the test
is
started from the Diagnostic Monitor, a one-haif second
delay
is
incorporated to allow the
COUPLING
(test start)
switch to return to its normal
(open)
position. Table
6-4
defines the error
codes
that
may
be
encountered
when
a
switch
is
detected
as
closed.

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