95x Series Operating Manual - May 17, 2022
Page 67 of 155
Test Voltage Overshoot <5% (<0.25s ramp time)
<1%
Settling to <±0.1% of final value in <0.5sec
CURRENT MEASUREMENTS (DUT ISOLATED)
Measurements are performed in the RETURN terminal of the 95x.
Breakdown Current 1uA to 280mApk (DC-50kHz bandwidth)
<(± 1% ± 1uA) accuracy
<30usec detection time
<3msec response time (typically <500usec)
Leakage Current 0.0nA to 200mA
7.25msec measurement period (100ms for dwell time >2 sec)
<(± 0.25% ± 0.5nA) accuracy
Capacitive Loading Effects :
951i, 952i and 956i : add X * (± 0.2nA ± (2.5nA per KV))
953i, 954i and 955i : add X * (± 0.3nA ± (3.5nA per KV))
957i : add X * (± 0.5nA ± (5nA per KV))
X = (C/0.01uF) below 0.01uF, or X = √(C/1uF) above 1uF, or otherwise X = 1.0
Arc Current 1 to 30mArms (50KHz-5MHz bandwidth)
<(± 10% ± 1mA) accuracy at 1MHz
4us, 10us, 15us, 20us, 30us or 40us measurement period
Cable Compensation <(± 1% of error)
RESISTANCE MEASUREMENTS (DUT ISOLATED)
Measurements are performed between the HV and RETURN terminals of the 95x.
For applied voltage, breakdown current and arc current accuracies see above.
In the chart below R is the reading in Ohms, C is the capacitive loading. Interpolate between voltages as needed,
for accuracies at capacitances above 5uF consult Vitrek. Accuracies are shown as the percentage of the reading.
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