95x Series Operating Manual - May 17, 2022
Page 68 of 155
10K-60GΩ : ±0.7%±(R/2GΩ)%
10K-25GΩ :
±0.7%±(R/800MΩ)%
10K-15GΩ :
±0.7%±(R/500MΩ)%
10K-150GΩ : ±0.6%±(R/5GΩ)%
10K-40GΩ : ±0.6%±(R/1.3GΩ)%
10K-25GΩ :
±0.6%±(R/750MΩ)%
17K-300GΩ :
±0.6%±(R/10GΩ)%
17K-60GΩ :
±0.6%±(R/1.75GΩ)%
17K-30GΩ :
±0.6%±(R/900MΩ)%
34K-600GΩ :
±0.6%±(R/20GΩ)%
34K-75GΩ : ±0.6%±(R/2GΩ)%
34K-35GΩ : ±0.6%±(R/1GΩ)%
84K-1.5TΩ : ±0.6%±(R/50GΩ)%
84K-80GΩ : ±0.6%±(R/2.5GΩ)%
84K-40GΩ : ±0.6%±(R/1GΩ)%
167K-3TΩ :
±0.6%±(R/100GΩ)%
167K-90GΩ :
±0.6%±(R/2.5GΩ)%
167K-40GΩ : ±0.6%±(R/1GΩ)%
1.34M-6TΩ :
±0.6%±(R/200GΩ)%
1.34M-90GΩ :
±0.6%±(R/2.5GΩ)%
1.34M-40GΩ :
±0.6%±(R/1GΩ)%
10K-60GΩ : ±1.2%±(R/2GΩ)%
10K-20GΩ :
±1.2%±(R/500MΩ)%
10K-10GΩ :
±1.2%±(R/300MΩ)%
25K-150GΩ : ±1.1%±(R/5GΩ)%
25K-30GΩ : ±1.1%±(R/1GΩ)%
25K-15GΩ :
±1.1%±(R/500MΩ)%
50K-300GΩ :
±1.1%±(R/10GΩ)%
50K-40GΩ : ±1.1%±(R/1.3GΩ)%
50K-20GΩ :
±1.1%±(R/650MΩ)%
100K-600GΩ :
±1.1%±(R/20GΩ)%
100K-50GΩ :
±1.1%±(R/1.5GΩ)%
100K-25GΩ :
±1.1%±(R/700MΩ)%
250K-1.5TΩ :
±1.1%±(R/50GΩ)%
250K-60GΩ :
±1.1%±(R/1.75GΩ)%
250K-25GΩ :
±1.1%±(R/800MΩ)%
500K-3TΩ :
±1.1%±(R/100GΩ)%
500K-60GΩ :
±1.1%±(R/1.8GΩ)%
500K-25GΩ :
±1.1%±(R/800MΩ)%
1M-6TΩ : ±1.1%±(R/200GΩ)%
1M-60GΩ : ±1.1%±(R/1.8GΩ)%
1M-25GΩ :
±1.1%±(R/800MΩ)%
3M-10TΩ : ±1.6%±(R/300GΩ)%
3M-60GΩ : ±1.6%±(R/1.8GΩ)%
3M-25GΩ :
±1.6%±(R/800MΩ)%
CURRENT MEASUREMENTS (DUT GROUNDED, OPTION HSS ONLY)
Measurements are performed in the HV terminal of the 95x.
Breakdown Current 1uA to 50mApk (DC-50kHz bandwidth)
<(± 1% ± 1uA) accuracy
<30usec detection time
<3msec response time (typically <500usec)
Leakage Current 0.00uA to 50mA
7.25msec measurement period (100ms for dwell time >2 sec)
<(± 1% ± 50nA ± (10nA per KV)) accuracy
Capacitive Loading Effects :
Add X * (± 0.2nA ± (2.5nA per KV))
X = (C/0.01uF) below 0.01uF, or X = √(C/1uF) above 1uF, or otherwise X = 1.0
Cable Compensation <(± 1% of error)
CURRENT MEASUREMENTS (DUT GROUNDED, OPTION HSS-2 ONLY)
Measurements are performed in the HV terminal of the 95x.
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