IEEE 1588 Analysis
247
BW filter window Window length expressed in seconds for the linear filtering
processing block placed before the MTIE and TDEV block.
Unlike the selection filter, the linear filtering operates by aver-
aging sample values before they are used to compute the
MTIE and TDEV values. With this operation, it is pretended
to simulate the behaviour of a real timing synchronization cir-
cuit that always tends to average the samples on its input.
The BW filter window length is subject to the same kind of
trade off that than the selection window. The longer the win-
dow the more accurate results but longer windows involve
longer test periods as well.
Mask source Configures the origin of the MTIE and TDEV masks to be
used in the next measurement.
The only currently allowed mask source is Standard, that
configures the MTIE / TDEV mask from an ITU-T or an ETSI
standard
Standard Selects the MTIE and TDEV mask to be used in the next
measurement when Mask source is set to Standard. Masks
belong to one of four different groups:
• Masks for TDM interfaces. This group contains the PDH
G.823 / EN 300 462-3-1, PDH G.8261 CES 2048 kb/s (1),
PDH G.8261 CES 1544 kb/s (1) and PDH G.8261 CES
(2A).
• Masks for Primary Reference Clock (PRC) outputs. These
are the PRC G.811, PRC G.823 and PRC EN 300 462-3-1
masks.
• Masks for SDH Equipment Clock (SEC) outputs, including
the SEC G.823 / EN 300 462-3-1, SEC G.813 / EEC
G.8262 Constant Temperature (1), SEC G.813 / EEC
G.8262 Constant Temperature (2), SEC G.813 Holdover
(2), SEC G.813 / EEC G.8262 Noise tolerance (1), SEC
G.813 / EEC G.8262 Noise tolerance (2), SEC G.813
Noise transfer (2), SEC G.813 Ref. sw. / EEC G.8262
Phase disc. (2), SEC G.813 / EEC G.8262 Variable tem-
perature (1).
Table 9.10: Wander Test Configuration Parameters
Setting Description
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