Synchronous Ethernet Analysis
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5. From the Home panel, go to TEST
The test configuration panel is displayed.
6. In the SyncE wander test field, configure MTIE / TDEV.
7. Configure the Observation time to one of the allowed values. The test finishes
automatically when the Observation time is reached.
8. Configure the Mask source and Standard mask parameters for the next MTIE /
TDEV measurement.
The unit is now ready to run the test and read the results. To do that, this is the correct
procedure:
1. From the Home panel, go to RESULTS,
The test port results panel is displayed.
2. Select Port A to enter in the port specific results.
3. Enter in SyncE wander to display the Synchronous Ethernet synchronization
results.
4. Go to Wander analysis.
5. Run the test by pressing the run key.
6. Check the Overflow, TIE, Offset, Max. offset, Drift and Max. drift results.
7. Leave the current panel and choose between MTIE or TDEV.
8. Check the Time, TIE, MTIE and Mask results (MTIE results panel) or Time, TDEV
and Mask results (TDEV results panel).
Note: MTIE and TDEV test results could be displayed either through a table or in
graphical format with the help of a contextual button.
Table 10.1: Wander analysis results
Result Description
Overflow This is an indication about TIE measurement overflow. TIE
dynamic range is ±2 s. If the phase excursion is higher than
this value, the displayed TIE will not be correct. To indicate
this condition, the Overflow field displays Yes.
TIE Displays the current Time Interval Error (TIE). The TIE is the
cumulative phase error from the beginning of the test.
The allowed dynamic range for the TIE is ±2 s. Results out of
this range will generate an overflow event.
Offset Difference between the frequency of the received signal and
the reference signal frequency measured in parts per million
(ppm).
Measurement of the frequency offset does not require to run
a measurement. It is a permanent result that is available
even if there is not an ongoing test.
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