Measurement Range 0%–20%.
Accuracy ±0.5 dB.
Residual IMD
16
£0.0015% [–96.5 dB], 60/7 kHz or 250/8 kHz.
CCIF and DFD IMD Functions
Test Signal Compatibility Any combination of equal amplitude tones from
4 kHz–100 kHz spaced 80 Hz–1 kHz.
IMD Measured
CCIF 2
nd
order difference frequency product relative to
the amplitude of either test tone.
DFD u
2
(2nd order difference frequency product)
per IEC 268-3 (1986).
Measurement Range 0%–20%.
Accuracy ±0.5 dB.
Residual IMD
15
CCIF £0.0004% [–108 dB], 14 kHz + 15 kHz,
DFD £0.0002% [–114 dB], 14 kHz + 15 kHz.
DIM (TIM) IMD Function
Test Signal Compatibility 2.96 kHz–3.15 kHz squarewave mixed with
14 kHz–15 kHz sine wave (probe tone).
IMD Measured
17
u
4
and u
5
per IEC 268-3 (1986).
Measurement Range 0%–20%.
Accuracy ±0.7 dB.
Residual IMD15 £0.0020% [–94 dB].
Wow & Flutter Measurements
with option “W&F”
Option “W&F” adds the capability to make both conventional wow & flutter and
scrape flutter measurements (using the technique developed by Dale Manquen of Altair
Electronics, Inc.). The demodulated W&F signal can also be selected for FFT analysis
in SYS-2712 and SYS-2722 configurations.
Test Signal Compatibility
Normal 2.80 kHz–3.35 kHz.
“High-band” 11.5 kHz–13.5 kHz.
Measurement Range 0%–1.2%.
Accuracy (4 Hz) ±(5% of reading + 0.0005%).
Detection Modes IEC/DIN (quasi-peak per IEC-386),
NAB (average),
JIS (per JIS 5551).
Chapter 6: Specifications Analog Analyzer
62 Getting Started with Your 2700 Series Instrument
16
System specification measured with the 2700 series analog generator at any valid input level ³200 mVrms.
17
IEC 268-3 defines nine possible DIM products. The 2700 series IMD option analyzer is sensitive only to the
u4 and u5 products using the simplified measurement technique proposed by Paul Skritek. DIM measurements
using this technique will typically be 6 dB–8 dB lower (better) than the results obtained using FFT-based
techniques which sum all nine products.