13.3 Measurement Specifications
176
Voltage waveform peak (Upk)
Measurement method Measured every 10 cycles (50 Hz) or 12 cycles (60 Hz); maximum and minimum points sampled
during approx. 200 ms aggregation.
During 400 Hz measurement, measured every 80 cycles; maximum and minimum points sampled
during approx. 200 ms aggregation.
Sampling frequency 200 kHz
Displayed item Positive peak value and negative peak value
Measurement range, resolution Area of the RMS voltage range to which the crest factor was added. 1200.0 Vpk
Measurement band See RMS frequency characteristics.
Measurement accuracy -
Event threshold 0 to 1200 V (value before setting VT ratio) 1 V increments, absolute value comparison
Event IN Start of approx. 200 ms aggregation in which threshold was exceeded
Event OUT Start of first approx. 200 ms aggregation after IN state in which threshold was not exceeded
Multiple-phase system treatment Separate by channel
Saved waveforms Event waveforms
Current waveform peak (Ipk)
Measurement method Measured every 10 cycles (50 Hz) or 12 cycles (60 Hz); maximum and minimum points sampled
during approx. 200 ms aggregation.
During 400 Hz measurement, measured every 80 cycles; maximum and minimum points sampled
during approx. 200 ms aggregation.
Sampling frequency 200 kHz
Displayed item Positive peak value and negative peak value
Measurement range, resolution Area of the current range to which the crest factor was added.
Measurement band See RMS frequency characteristics.
Measurement accuracy -
Event threshold 0 to (rated current of clamp sensor being used × 4) A (value before setting CT), absolute value
comparison
Event IN Start of approx. 200 ms aggregation in which threshold was exceeded
Event OUT Start of first approx. 200 ms aggregation after IN state in which threshold was not exceeded
Multiple-phase system treatment Separate by channel
Saved waveforms Event waveforms
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